An expression for energy transfer probability （η） between host （TPD） and guest （Ir（ppy）3） phosphorescent systems is proposed,and the energy transfer process in doped organic electrophosphorescent （EP） devices is discussed. The results show that （1） The rate of the triplet energy transfer （KHG and KGH） exponentially increases with the host-guest molecular distance （R）, and KHG decreases quickly as the intermolecular distance of the guest （RGG） increases. In addition,the KHG/KGH ratio of the dopant system increases when R or RGG is reduced; （2） The energy transfer probability approximately linearly decreases as R increases from 0.8 to 1.2nm,and the variation of RGG can be neglected when R〈1.1nm. For 1. 1nm〈R〈l. 2nm, RGG （〈1.6nm） plays an increasingly important role when 71 drops with the latter＇ （3） η increases when the Forster energy transfer rate increases or Gibb＇s energy declines.
A diamond-like carbon （DLC） film is deposited as an electron injection layer between the polymer light-emitting layer（MEH-PPV） and aluminum （Al） cathode electrode in polymer electroluminescence devices （PLEDs） using a radio frequency plasma deposition system. The source material of the DLC is n-butylamine. The devices consist of indium tin oxide （ITO）/MEH-PPV/DLC/Al. Electron injection properties are investigated through I-V characteristics,and the mechanism of electron injection enhancement due to a thin DLC layer has been studied. It is found that： （1） a DLC layer thinner than 1.0nm leads to a higher turn-on voltage and decreased electroluminescent （EL） efficiency; （2） a 5.0nm DLC layer significantly enhances the electron injection and results in the lowest turn-on voltage and the highest EL efficiency; （3） DLC layer that exceeds 5.0nm results in poor device performance;and（4） EL emission can hardly be detected when the layer exceeds 10.0nm. The properties of ITO/MEH-PPV/DLC/Al and ITO/MEH-PPV/LiF/Al are investigated comparatively.
