Porous silicon samples are made on Si wafers with different resistivities under different anod ic-react ion conditions. Visible photoluminescent spectra of porous silicon (PS) at room temperature are measured using a fluorescent spectrograph where blue-violet light is observed. The decision of the resistivity of Si substrates is provided.
The multilayers in the forms of glass/Cu(Ni)(5.0 nm)/[Co(2.0 nm)/Cu(Ni)(0.5～3.7 nm)] 30 and glass/Ti(5.0 nm)/[Co(2.0 nm)/Ti(0.4～3.5 nm)] 30 ,prepared by dual facing target sputtering at room temperature,exhibit a soft magnetic property.The structural and magnetic properties of Co/Cu(Ni) and Co/Ti multilayers were examined as a function of the spacer layer thickness (d Ti and d Cu(Ni) ) by low angle X ray diffraction (LAXRD) and VSM measurements.The saturation magnetization M s of the Co/Ti multilayers was found to decrease with d Ti and approached to a constant value when d Ti was thick enough.But in the Co/Cu(Ni) multilayers,the M s was found to oscillate with d Cu(Ni) when d Cu(Ni) was less than 3.0 nm,and the oscillation period was about 1.0 nm.This arose from the different interlayer magnetic coupling effects.We interpret these two different kinds of interlayer magnetic couplings as the consequence of the competition between the RKKY like and superexchange couplings.
